(pressebox) Herrsching am Ammersee, 22.10.2009, Since many years the streak technology is well established as the high-end method for time-resolved fluorescence spectroscopy. It is employed in a range of complete measurement systems Hamamatsu is offering. Other well-known methods in this field are time-correlated single photon counting (TCSPC) using a PMT or MCP-PMT as a detector, [...]
Tag Archive > Measurement Systems
ADLINK Technology Expands Its GPIB Family with New USB-GPIB Interface Product, USB-3488A
(pressebox) Duesseldorf, 08.07.2009, ADLINK Technology Inc. (TAIEX:6166), a global provider of PC-based test and measurement systems and modules, announced the release of the USB-3488A, a cost-effective IEEE-488 GPIB to USB interface controller. The USB-3488A is fully IEEE 488.1 and IEEE 488.2 compatible and provides the benefits of "plug-and-play" USB connection for simple direct connection of GPIB [...]
Düsen-Schlick technologies is exhibiting at the Achema 2009
(pressebox) Untersiemau/Coburg, 28.04.2009, Düsen-Schlick is one of the worldwide leading nozzle manufacturers, offering the entire range of services relating to the use of nozzles starting from research and development through to production and service, all from one source. Providing solutions without delay. Trend-setting patents, such as ABC-Technology®, ensure the company’s production success in the areas [...]
Agilent Technologies to Collaborate with ASTER for Seamless Test Coverage Analysis across Test Platforms
(pressebox) Santa Clara, Calif., 18.03.2009, Agilent Technologies Inc. (NYSE: A) today announced its strategic partnership with ASTER to enable integration of ASTER’s "TestWay Coverage Analyst (TCA)" across Agilent’s printed circuit board assembly test platforms. The TestWay Coverage Analyst provides a push button test coverage analysis tool for coverage estimation (pre-test program development) and coverage measurement [...]
Free Keithley Web-Based Seminar Explores Fundamentals of Hall Effect Measurements
(pressebox) Cleveland, Ohio, 12.02.2009, Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Hall Effect Measurements Fundamentals" on Thursday, February 19, 2009. This one-hour seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization. To [...]
Group Introduces New Suite of Aligners and Measurement Systems for 3D IC and Other Advanced Semiconductor, MEMS and Nanotechnology Device Manufacturing
The ‘NT’ Series Significantly Increases Both Alignment and Measurement Accuracy to Enable Better Device Performance and Lower Manufacturing Costs (pressebox) St. Florian/Inn, 02.12.2008 – EV Group (EVG), a leading supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, today introduced the NT series — a new, yet already field-proven suite [...]
